Development and Implementation of Built-in Testing Techniques for Analog and Rf Integrated Circuits

The objective of this research is to develop built-in testing (BIT) techniques for the functional verification of analog and RF circuits and systems. The aim is to avoid the use of external analog instrumentation so that the cost of testing is reduced. The major challenges addressed by this work are: (1) To develop techniques for the on-chip test of integrated RF and analog circuits through a fully digital offchip interface. (2) To develop methodologies for the use of the proposed techniques in the efficient testing of integrated systems. (3) To realize and evaluate integrated implementations of the BIT architectures in a mainstream CMOS technology. At the circuit-level design, the emphasis is placed on attaining compact and robust BIT building blocks which can operate without significantly affecting the performance of the circuit under test (CUT).